1. PURPOSE. This test is conducted for the purpose of detecting contact-chatter in electrical and electronic component parts having movable electrical contacts, such as relays, switches, circuit breakers, etc., where it is required that the contacts do not open or close momentarily, as applicable, for longer than a specified time-duration (see 4.3) under environmental test
conditions, such as vibration, shock, or acceleration. This test method provides standard test procedures for monitoring such \"opening of closed contacts\" or \"closing of open contacts\".
1.目的:這測試執行確定在電器和電子零件部份有作切換電器接觸時的接點抖動目的,如繼電器,開關,電流斷路器,等。接觸的地方不能有短暫的斷開或導通。如適用的環境試驗條件下,特定的持續長時間期間(見4.3),如:振動,衝擊或加速。這檢驗方法提供標準測試程序對於監測如”閉合接點打開”或 ”打開接點閉合”兩種測試電路。
2. TEST CIRCUITS. 2.測試電路
2.1 Selection. In this method there are two test-circuits: A (see 3.1), and B (see 3.2). The selection of the test-circuit depends largely upon the type of electrical contacts to be tested. Test-circuit B is preferred, whenever possible, to avoid contact contamination caused by the formation of carbonaceous deposits on the contacts. The individual specification shall specify the test-circuit and time-duration (see 4.3) required in connection with monitoring of shock and vibration tests. The test-circuits listed herein are \"recommended\" reference circuits. Any comparable test-circuit which meets the test requirements and the calibration procedures as stated herein , may be used for this test.
2.1選擇.這方法有兩個測試電路:A(見3.1),和B(見3.2)。測試電路的選擇取決於主要根據電氣接觸的類型來做測試。測試電路B是首選的, 盡可能, 以避免接觸形成的積炭造成的接觸污染。特定規格應註明衝擊的監測和震動測試時測試電路和持續時間的要求。呈列於此的測試電路為建議的參考電路。任何類似的測試電路都應符合本文中指定的測試要求和校正程序,才能被用作使用測試。
2.1.1 Selection of test-circuit A. Test-circuit A is for monitoring test-specimens with a single set of contacts, for the opening of normally-closed contacts or false closures of normally- opened contacts (see figure 310-1). Test-circuit A should not be specified for specimens whose capability includes low-level or dry-circuit ratings (10 milliamperes or less and 2 volts or less for openings or closings less than 10 microseconds); since the current through the electrical contacts under test from the test-circuit may cause arcing, thus damaging the contacts.
2.1.1 測試電路A的選擇。測試電路A是對於監測樣品-單一組連接設定,如正常導通接觸的 斷開或正常切斷接觸時不正確的導通(見圖310-1)。測試電路A不應指定測試樣品其 功能包含低等級或微電路等級(10mA或更低和2V或切斷時間或導通時間比10µs更低 )；因為在測試情況下從測試電路電流穿過電子觸點可能造成電弧,從而損壞接觸 觸點。
2.1.2 Selection of test-circuit B. Test-circuit B is for monitoring test-specimens with a single set of contacts, for the opening of normally-closed contacts and false closures of normally- open contacts (see figure 310-3). Test-circuit B should not be used for openings or closings of less than 10 microseconds. Test-circuit B does not allow current in excess of 20 milliamperes or an open-circuit voltage in excess of 2-volts during monitoring; which insures that there will be no arcing, which will cause damage, to low-level and dry-circuit test specimens.
2.1.2 選擇測試電路B。測試電路B是對於監控測試樣品-一組接點設定,如正常導通接觸 的斷開或正常切斷接觸時不正確的導通(見圖310-3)。測試電路B不應使用於切斷或 導通時間低於10µs的開關。測試電路B不允許測試電流超過20 m A或 或在監測期間 開路電壓超過2V; 在測試低等級和微電流的樣品期間,應保證樣品沒有電弧和造成損害 發生。
註: A-低於切換時間10µs ,B-不應低於切斷或導通時間低於10µs。 3. TEST SYSTEMS. 3.測試系統
3.1 Test-circuit A. The test circuit shall be the thyratron circuit shown on figure 310-1 or an
approved equivalent circuit. The values for R1, C1, and the suppressor grid-cathode voltage, controlled by R7, principally controls the firing of the thyratron and are so chosen that the thyratron will fire when the duration of the contact-opening exceeds the time-duration
specified in the individual specification (see 4.3 and 5). For the longer time-durations, such as above 1 millisecond, it may be necessary to change the values of R2, R5, and R6.
3.1測試電路A。測試電路應如圖310-1所示的閘流管電路或適當等效電路。R1,C1和抑制 柵極電壓值由R7來作控制,主要是在控制閘流管的觸發和當接觸斷開超過在特定規 格指定的時間期間,閘流管將改變觸發(見4.3章和5章)。對於較長的持續時間,如1ms 以上,它需要改變R2,R5和R6的阻值。
a. To monitor normally-closed contacts, the normally-closed contacts are connected to BP1 and BP2, with switch S1 in the \"normally-closed position\". The grid of the thyratron is placed at ground potential. The cathode of the thyratron is at a positive potential (depending on the setting of R7), thus providing sufficient negative bias to cut the thyratron \"off\". Any contact chatter (opening of closed contacts) will cause the grid of the thyratron to rise exponentially to +150 volts at a rate determined by the preselected time constant of R1 and C1. As long as the contacts remain open, the grid potential will continue to rise. If the contacts remain
\"open\" for longer than the specified interval, the grid potential rises to the point at which the thyratron conducts and ionizes, thus lighting DS1. Since, in a thyratron, the grid loses control of conduction as soon as the tube conducts, the contacts being monitored can reclose at any time thereafter without affecting the monitoring circuit. Thus, lamp DS1 will remain \"on\" until the thyratron is manually reset by operation of switch S2.
a.監測正常導通接觸,正常導通位置應是正常導通接點連接到BP1和BP2和Switch S1。閘流 管的柵極因放置於接地位置。而閘流管(SCR)的陰極(cathode)正確電位(取決在R7的設定), 從而提供了充足的負偏差,以切斷閘流管的為”切斷”。任何的接觸抖動(導通接觸點的 斷開)將造成閘流管的柵極, 透過預選的R1和C1的時間常數決定的速率成倍上升到+150
V。只要接觸保持斷開，柵極電位將繼續上升。如果觸點繼續斷開大於指定的時間間隔,柵極電位將爬升點到閘流管傳導和電離,從而點燃DS1。至從在閘流量管的柵極失去傳導控制立刻由管做傳導，被監視的接觸，可以在任何重合閘,此後的時間不影響監控電路。因此，DS1的燈泡將保持“導通”直到閘流管手動重新設置開關S2的操作。
b. To monitor normally-open contacts for false closures, it is necessary to operate switch S1 to the \"normally-open position\ constant charging circuit is \"open\". When open contacts are connected to BP1 and BP2 and the connection is made, these contacts \"close\". At contact closure, voltage is applied to the charging circuit, starting a build-up in the same manner as described in (a) for normally- closed contacts. At the conclusion of the test, if lamp DS1 is \"off\ chatter interval exceeding the specified duration; if the lamp is \"on\ one-interval when the specified time-duration was exceeded. After an indication of failure, the thyratron circuit shall be restarted by operation of switch S2.
b.對於監測正常斷開接觸時不正確的導通,它是需要操作開關S1到常開位置, 這樣的連接 介於150V和時間常數充電電路是斷開之間。當斷開觸點連接到BP1和BP2和連接之後, 那些連接觸點將”導通”。在接觸導通時, 電壓是適用於充電電路, 以同樣的方式開始建 立描述為正常閉觸點。在測試結速之後,如果燈DS1是關閉,之後它會有一個非抖動時 間間隔超過特定時間間隔;如果燈是”斷開”,當特定時間持續時間超過時它至少有一 個時間間隔。故障指示後,閘流管電路開關S2的操作應重新啟動。
3.1.1 Calibration procedure for test-circuit A. The calibration-circuit shown on figure 310-2 may
be used to calibrate the monitoring-circuit shown on figure 310-1 by using the following procedure:
3.1.1 測試電路A-校正程序。如圖310-2所示的校正電路能被用於校正監測電路如圖310-1 所示，通過使用以下步驟：
a. Make the proper connections of the monitoring-circuit to the calibration-circuit as shown, and set switch S1 to position A.
a. 設為監控電路的正確連接校準電路如圖所示，設置開關S1位置A。 b. Calibrate the oscilloscope triggering input as follows: b. 校正示波器觸發輸入如以下:
(1) Set switch S4 to position A, so that the trigger input is connected to the Y-axis input of the oscilloscope.
(1)設定開關S4至位置A,所以觸發輸入是連接到示波器Y軸輸入。
(2) Set the time-base control of the oscilloscope for approximately 20-percent of the time- duration for which the calibration is being made.
(2)設定示波器的時間基準控制大約為校正設定的持續時間20%。 (3) Set the Y-amplitude of the oscilloscope for 1-volt per centimeter. (3) 示波器的Y-振幅為1V/cm。
(4) Set the triggering coupling to ac sensitivity. (4) 設定觸發偶合至AC感應。
(5) Open the switch S3 and adjust the triggering level and stability control so that the trace on The oscilloscope will trigger at 0.5-volt or less. The closer the trigger-level is to zero, the greater the accuracy of calibration.
(5) 打開開關S3和調整觸發水平和穩定的控制，以便示波器軌跡將觸發在0.5V或以下。 當觸發水平越接近0，其校正的精度須越大。
c. Set switch S4 to position B, so that the Y-axis input of the oscilloscope is connected through capacitor C4 to the plate of the thyratron in the test circuit.
C.設定開關S4至位置B,其示波器的Y軸是在測試電路中是透過電容C4到閘流管的陽極作 連接。
d. Close switch S3. d.關閉開關s3。
e. Set the Y-amplitude of the oscilloscope for a usable display, and the time-base as in preceding (b) (2).
e.對於可用的顯示範圍設定示波器的Y-振幅,和時間基準如前面(b)的第(2)。
f. Depress monitor-circuit reset switch S2 of figure 310-1 to set the circuit in the \"ready\" position, i.e., with the circuit being calibrated and lamp DS1 extinguished.
f.減少監控電路重新設定圖310-1的開關S2去設定電路到”準備”位置, 即校準電路和燈DS1 的熄滅。
g. Open switch S3; the observed trace of the oscilloscope should move across the screen at a positive amplitude until it is deflected downward by the negative pulse created when the thyratron fires. The time interval between the start of the trace and the negative pulse is the detection time. Adjust R7 of figure 310-1 to the time-duration specified in the individual specification.
g.打開開關S3:觀察示波器軌跡應橫相移動在正極振幅直到閘流管點燃陰極脈衝產生偏移下 降。軌跡的開始和負脈衝之間的時間間隔是檢測時間。調整圖310-1的R7至持續時間規 定在特定規格內。
( 圖表 310-1)
Resistors Capacitors
R1 - 35K 1/2W, 1% (see note 1) C1 - .0022μF, 600 VDCW (see note 1) R2 - 27K 1/2W, 5% R3 - 47K 1W, 5% R4 - 200K 1/2W, 5%
R5 - 70K 1W, 5% R6 - 2.4K 1W, 5% R7 - 5K 1W R8 - 500 1/2W, 5% Miscellaneous DS1 - NE-51 S1 – DPDT
S2 - SPSTNC 125V 1 amp (push) V1 - JAN-5727/2D21W
NOTES:(註)
1. These values are to be chosen to obtain the desired time-duration for the applicable test condition (see 4.3).These particular values are applicable to 10 microseconds time-duration only.
1. 對於適合測試條件(見4.3)這些值是被挑選而獲得想要的持續時間。那些特定的值緊適用 於10µS的持續時間。
FIGURE 310-1. Test-circuit A; monitor circuit for contact-opening and closing. 圖310-1。測試電路A;接點斷開和導通的監測電路。
( 圖表 310-2)
NOTE: The oscilloscope shall have an accuracy of ±3 percent or better on time base and have provision for external triggering.
註:示波器應有±3%的精確度或好的時間基準和有外部觸發的提供。 FIGURE 310-2. Calibration circuit for test-circuit A. 圖310-2。測試電路A的校正電路
3.2 Test circuit B. The monitor-circuit shown on figure 310-3 permits detection of contact- chatter of closed contacts and false closure of open contacts, independently or
simultaneously. The low contact-load levels (see 2.1.2) insure that there will be no arcing of the contacts during monitoring.
3.2測試電路B。這監測電路在圖310-3所示,它允許導通觸點的接觸抖動的檢測和斷開觸點 的錯誤導通的檢測,單獨或同時發生。低接觸負載等級(見2.1.2)確保其監控期間的接 觸不會有電弧的發生。
a. The chatter portion of figure 310-3, resistors R3 and R4 form a voltage divider with their junction at +2 volts. The closed contacts of the component under test, short-circuit R4 and place the base of transistor amplifier Q1 to ground potential. When the contacts under test \"chatter\" (open), resistor R4 is no longer short-circuited and capacitor C1 starts to charge through R2 and R7 to +2 volts. The time necessary for C1 to charge to the correct bias-level is determined by the resistance of R2 and R7 and the capacitance value of C1. As transistor Q1 draws current through the gate of SCR1, the unit will fire and turn-on lamp DS1. Since
in a silicon-controlled rectifier, the gate loses control after it is turned \"on\ reclose at any time thereafter without affecting the monitoring circuit. The time-delay, before turn-on, can be adjusted by varying R2 and selecting the capacitance value of C1. (For example: C1 = .002 μF gives a 10-microsecond open-contact time.)
a. 圖310-3的抖動部份,電組R3和R4組成一個電壓分壓器在2V連接處。在測試下零件的導通接觸,短路R4和放置在電晶體放大器(Q1)的基極到接地電位處。當測試抖動(斷開)下的接觸,電阻R4不在是短路和電容C1開始充電穿過R2和R7到2V。對C1充電到正確的偏壓等級時間需求是取決於R2電阻和R7和C1的電容值。由於電晶體Q1吸引電流通過SCR1的柵極,直到點然和打開燈DS1。由於在一個矽控整流流器,柵極失去控制之後它會轉成\"導通\接觸點能重新導通之後在任何時間不影響監控電路。在導通之前的時間延遲能由改變R2和選擇C1電容值來作調整。(例如：C1= 0.002μF的給出了一個10μS的斷開接觸時間。)
b. In the false-make portion of figure 310-3, transistor-amplifier Q2 is normally \"on\" with the gate of SCR2 being effectively held at ground potential by the low-output impedance of
transistor Q2. When a \"false-make\" occurs, the base of Q2 transistor is grounded, turning Q2 \"off\". This allows the gate of the SCR2, which is tied to the collector of transistor Q2, to rise to +12 volts. The rate of increase is determined by the value of C2 and R8. (For example: C2
= .002 μF gives a 10-microsecond false-make time.) When the voltage reaches the gate turn-on level of SCR2, lamp DS2 will light, indicating a false closure of the open contacts.
b.在圖310-3錯誤製造部份,電晶體放大器Q2在正常導通時與SCR2的柵G極藉由Q2的低 輸出阻抗將有效地流到接地電位處(即SCR2的GATE到Q2到接地)。當一個錯誤的動作 產生,電晶體Q2的基(B)極是接地,之後Q2轉成斷開。允許SCR2的柵極(Gate), 連繫到電 晶體Q2 的集極(C)，上升到12V。增加率是取決於C2和R8的值。當電壓達到時SCR2的 柵極切換導通等級,燈DS2將亮起,指示切斷接觸的錯誤的導通發生。
c. When this circuit is being used to simultaneously monitor both the open and closed contacts of a double set of contacts:
c. 當這電路被使用於同時監控一個雙接觸設定兼有切斷和導通接觸的部份: (1) If DS1 \"lights\(1)如果 DS1”亮啟”,表示觸點抖動。
(2) If DS1 and DS2 \"lights\ movable contact of the open circuit \"closes\" but the closed circuit has not opened.
(2)如果DS1和DS2 都亮啟,表示錯誤轉換的指示或可能橋接,例如:開路的移動接觸到”導通” 但短路沒有被斷開。
(3) If DS2 \"lights\(3)如果DS2”亮啟”,表示橋接指示。
d. Restoration of the circuit for an indication of failure is accomplished by the operation of S1. d. 對於故障的指示可藉由S1的操作來恢復電路。
3.2.1 Calibration procedure for test-circuit B. The calibration-circuit shown on figure 310-4 may be used to calibrate the monitoring-circuit shown on figure 310-3 by using the following procedure:
3.2.1對於測試電路B的校正程序。校正電路在圖310-4所示能被使用在圖310-3所示的監 測電路中,使用程序如下
a. Make the proper connections of the monitoring-circuit to the calibration-circuit. a. 作出適當的監控電路到校正電路的連接。
(1) BP1 and BP2 for contact-chatter calibration. (1)對BP1和BP2做接觸抖動校正。
(2) BP1 and BP3 for false contact-make calibration. (2)對BP1和BP3做錯誤製造的校正。
b. Select the appropriate 5 volt square-wave \"pulse-polarity\" and \"pulse-width\" to be furnished by the pulse generator and monitor the pulse on the oscilloscope, as follows:
b. 選擇適當的5V方波“脈衝極性”和“脈衝寬度”由脈衝發生器的提供的和示波器的 監視脈衝，如下：
(1) For contact-chatter calibration: Negative pulse. (1)對於接觸抖動校正:使用負脈衝波形。
(2) For false contact-make calibration: Positive pulse. (2)對於錯誤接觸製造校正:使用正脈衝波形。
(3) Pulse width for either of the preceding (1) or (2) equal to the required detection time. (3) 對任一前(1)或(2)項所需的檢測時間等於脈衝寬度。
c. If DS1 or DS2 (as applicable) \"lights\C.如果DS1或DS2(如適當)”亮啟”,調整R2或R8直到燈熄滅。
d. Slowly adjust R2 and R8 (as applicable) to the time-duration specified in the individual specification, as indicated by the first point at which DS1 or DS2 \"lights\".
d.慢慢的調整R2和R8(如適當)至個別規格中指定的時間期限內, 如第1點DS1或DS2的“亮啟”顯示。
(圖310-3)
C1, C2 - Choose for specified time (see note 1) R6 - 1,000 ohms 1/4W, 5% DS1, DS2 - No. 344 Lamp R7 - 100 ohms 1/4W, 5% R1 - 750 ohms 1/4W, 5% R8 - 200 ohms pot.
R2 - 2,000 ohms pot. Q1, Q2 - 2N332A or equivalent R3, R5 - 10,000 ohms 1/4W, 5% SCR1, SCR2 - 2N1595 or equivalent R4 - 2,500 ohms 1/4W, 5% S1 - SPST NC Push
NOTE: 註:
1. Use 0.0022 μF for 10 microsecond time-duration. Other time-duration will require larger capacitors.
1. 對於10µS持續時間使用電容0.0022 μF。其它持續時間將需要更大的電容。 FIGURE 310-3. Test-circuit B; monitor circuit for contact-chatter and false closures. 圖310-3。測試電路B;對於接觸抖動和錯誤的導通的監測電路。
( 圖表 310-3)
NOTES:(註)
1. The square-wave pulse generator and oscilloscope shall have an accuracy of ±3 percent or better.
1.方波脈衝產生器和示波器應有±3%的精確度或更好。
2. The ratio of off-time to detection-time shall be 10:1 or better.
2.斷開時間的速率取決時間應10:1或更好。 FIGURE 310-4. Calibration circuit for test-circuit B. 圖310-4。對於測試電路B的校正電路 4. PROCEDURE. 4.程序:
4.1 Preparation. The monitor-circuits of figures 310-1 and 310-3 shall be calibrated, immediately prior to use, using the applicable calibration-circuit (see figures 310-2 and 310-4,
respectively). The calibration-circuit shall then be disconnected from the monitoring-circuit. 4.1事前準備。圖310-1和310-3監控電路應被校正,在使用前應先校正,使用適當校正電路 (見圖310-2和310-4,各別地)
4.2 Points of connection. The contacts of the test-specimen being monitored shall be connected to points BP1 and BP2 for test circuit A for both contact-chatter and false-make contact conditions. For test circuit B, the points of connection shall be BP1 and BP2 for contact- chatter condition and to points BP1 and BP3 for false-make contact condition. The test specimen shall then be subjected to the shock, vibration, acceleration, or other
environmental test during which this contact-chatter monitoring test method is to be used. If specified in the individual specification, test specimens having normally-closed contacts may be wired in series to monitor for opening of contacts, and those having normally-open contacts may be wired in parallel to monitor for closing of contacts. In this case, if contact opening or closing is indicated, it will then be necessary to reset each test specimen separately and monitor it individually to determine which one is defective.
4.2 連接點。測試樣品接觸被監測,對於測試電路A同時用於接觸抖動和誤觸發接觸的條件 應連接BP1和BP2點。對於測試電路B，接觸抖動條件應是接接BP1和BP2兩點和誤 觸發接觸的條件應是連接BP1和BP3兩點。測試樣品應受到衝擊,振動,加速或其它環境 測試,而在此期間應作接觸抖動的監測。如果指定個別規格,測試樣品對於接觸斷開能使 用串聯來監測有無正常導通接觸,和對於接觸導通能使用並聯來監測有無正常切斷連接。 在這種情況下,如果接觸斷開或接觸導通被顯示, 它接著需要單獨重設每一個測試樣品和 單獨監測,以確定哪一個有缺陷。
4.3 Test conditions. Test specimens shall be subjected to one of the following test conditions, as specified in the individual specification:
4.3測試條件。測試樣品應受到以下測試條見,如指定在個別的規格裡:
Test condition A B C D E Time duration 10 microseconds 100 microseconds 1 millisecond 5 milliseconds 20 milliseconds
5. SUMMARY. The following details are to be specified in the individual specification:
5.總結。以下細節規定在各別的規格裡: a. Test circuit letter (see 2.1, 3.1, and 3.2). a.測試電路文字(見2.1,3.1和3.2)
b. Test condition letter for maximum allowable time-duration of contact-opening or closing, as applicable (see4.3).
b.測試條件文字對於接觸斷開或導通之最大允許的持續時間。如適用(見4.3)。
c. Whether series-connection (of normally-closed contact test-specimens) or parallel-connection (of normally-open contact test-specimens) may be allowed (see 4.2).
c.是否常閉聯接測試樣品的串聯連接或常開接觸測試樣品的並聯連接能被允許(見4.2)。
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